Magnetic Force Microscopy Imaging of Current Paths
نویسندگان
چکیده
We demonstrate Magnetic Force Microscopy (MFM) imaging, at room temperature in air, of a 0.25mA DC current path in a 140nm-wide gold nanowire. The nanowire was created by focused ion beam milling of a 12μm wide Cr/Au line of 20nm/110nm Cr/Au thickness. Iterative fitting of the MFM data to an idealized model of the structure yielded a nanowire resistivity a factor of 3.5 higher than that of a control Cr/Au region which was unaffected by the ion beam processing. MFM imaging of an ion-implant patterned line shows current deflection around the implant region.
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